The P6330 enables users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications. The P6330 provides high-bandwidth, low circuit loading, and low-noise differential probing solutions. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface-mount devices.
Features:Please see Datasheet for complete details and specifications.